• 1 MHz to 300 MHz testing source frequency 

• Fastest test speed of 0.5 msec 

• ±0.72% rdg. basic accuracy 

• Compact, half-rack footprint with space-saving test head

• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)

• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode